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US 6,675,322 B1Granted
Integrated circuit having a self-test device
AssigneeSiemens Aktiengesellschaft
InventorsThilo Schaffroth, Florian Schamberger, Helmut Schneider
Life of this patent
Estimating the term…
Abstract
A self-test device serves for carrying out a self-test of an integrated circuit. An output of the self-test device is connected to a contact-making point of the circuit, which serves for external contact-making and which is connected to an input of a circuit unit of the integrated circuit to be tested. The self-test device feeds a test signal through the contact-making point to the circuit unit.
Claims6
An integrated circuit, comprising:
- a circuit unit to be tested, said circuit unit having an input;
- a contact-making point for external contact-making, said contact-making point connected to said input of said circuit unit to be tested;
- a self-test device for carrying out a self-test of the integrated circuit, said self-test device having an output connected to said contact-making point, and said self-test device feeding a test signal through said contact-making point to said circuit unit;
- an output driver connected between an output of said circuit unit and said contact-making point, for outputting signals of said circuit unit to a point outside the integrated circuit, in a normal operating mode of the integrated circuit;
- said output of said self-test device connected through said output driver to said contact-making point;
- and
- said self-test device transmitting the test signal through said output driver to said contact-making point, in a test operating mode of the integrated circuit.
4 more elements
The integrated circuit, comprising:
- a circuit unit to be tested, said circuit unit having an input;
- a contact-making point for external contact-making, said contact-making point connected to said input of said circuit unit to be tested;
- a self-test device for carrying out a self-test of the integrated circuit, said self-test device having an output connected to said contact-making point, and said self-test device feeding a test signal through said contact-making point to said circuit unit;
- an input driver connected between said contact-making point and said input of said circuit unit for feeding in external signals in a normal operating mode of the integrated circuit;
- an output driver connected between an output of said circuit unit and said contact-making point, for outputting signals of said circuit unit to a point outside the integrated circuit, in a normal operating mode of the integrated circuit;
- said output of said self-test device connected through said output driver to said contact-making point;
- and
- said self-test device transmitting the test signal through said output driver to said contact-making point, in a test operating mode of the integrated circuit.
5 more elements
Dependencies are inferred from the claim text.