Color optical inspection system
AssigneePhoton Dynamics, Inc.
InventorsWilliam K. Pratt, Owen Y. Sit
Life of this patent
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AssigneePhoton Dynamics, Inc.
InventorsWilliam K. Pratt, Owen Y. Sit
Estimating the term…
A color optical inspection system extracts only such luma and chroma spatial features as are necessary for detection of defects related to the physical characteristics of devices populating the surface of a board. During the training phase, the features of each device present on each of a number of golden boards is extracted and compared against a set of established criteria, thereby to select one or more spatial features to be extracted for the associated devices during the inspection phase. A match region whose boundaries are defined by the selected features of the devices on the golden boards is established during the training phase. During the inspection phase, the selected features of each associated device are extracted to determine whether they fall inside the match region. If the extracted features falls outside the corresponding match region, then a defect is reported.
A method for color inspection of a device present on a surface, the method comprising:
A method for color inspection of a device present on a surface, the method comprising:
An apparatus for color inspection of a device present on a surface, the apparatus comprising:
An apparatus for color inspection of a device present on a surface, the measurable feature extractor operative to extract first, second and third components of light in a first color space and received from at least one associated device;
Dependencies are inferred from the claim text.