Anodizing system with a coating thickness monitor and an anodized product

The anodizing system for forming a anodized coating on at least a portion of a substrate thereby creating an anodized substrate, said anodizing system including:

• (a) a bath into which the substrate is placed to facilitate the formation of the anodized coating on at least a portion of on the substrate thereby creating the anodized substrate;
• (b) a coating thickness monitor for measuring the thickness of at least a portion of the anodized coating on the substrate formed in said bath, said coating thickness monitor including:
• (i) at least one radiation source for providing radiation to be directed at at least a portion of the anodized substrate;
• (ii) at least one probe for directing said radiation at said at least a portion of the anodized substrate and for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from said radiation source;
• (iii) at least one detector in communication with said at least one probe, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate;
• (iv) at least one optical guide system capable of transmitting said provided radiation to said at least one probe and said captured radiation from said at least one probe to said at least one detector;
• and
• (c) at least one controller in communication with said coating thickness monitor and said bath.