US 6,674,318 B2 · Semiconductor integrated circuit

Abstract

A semiconductor integrated circuit includes a limiter circuit for outputting a voltage determining flag in order to set a boosted voltage level of a booster circuit to be a predetermined value, and a monitoring circuit for monitoring a monitoring node of the limiter circuit to output a monitoring signal for the stabilization of a boosted voltage to a first external terminal. The monitoring circuit detects a first level change of the voltage determining flag from “H” to “L” after the starting of the operation of the limiter circuit, by means of a comparator, to which an external power supply voltage and external reference voltage supplied from second and third external terminals are given, and thereafter, outputs a monitoring signal for holding a constant logical level during the operation of the limiter circuit. In order to provide a voltage trimming function, a voltage intended to be set in an external terminal may be given from the outside to deactivate a feedback system of the limiter circuit to operate a resistance value of the limiter circuit to detect and store a limiter flag. Thus, there is provided a semiconductor integrated circuit capable of simply monitoring the output voltage state of an internal power supply circuit by the external terminal and easily trimming an internal voltage.

Claims18

Dependent claims

A semiconductor integrated circuit, comprising:

a voltage comparing part which compares a predetermined voltage with a reference voltage;
an internal voltage generating part which generates an internal voltage on the basis of an output of said voltage comparing part;
and
a divided resistance part which potential-divides into said predetermined voltage by dividing an internal voltage node with resistance,
wherein said semiconductor integrated circuit has a test mode for determining an internal resistance value by supplying a desired trimming voltage from the outside to an external terminal connected to a first node which is a node between said internal voltage generating part and said divided resistance part, deactivating a feedback to said internal voltage generating part by the output of said voltage comparing part, and detecting a compared result which is the output of said voltage comparing part, in order to set said internal resistance value so as to be a desired voltage.

2 more elements

A semiconductor integrated circuit having a function capable of generating an internal voltage in relation to a reference voltage and fine-controlling an internal voltage value by bit data, said semiconductor integrated circuit comprising:

means for supplying a first voltage from the outside to an output node of an internal voltage generating circuit during a test;
means for detecting bit data in which a first voltage ratio is closest to a second voltage ratio, in which said first voltage ratio is a ratio between said internal voltage value and said reference voltage and in which said second voltage ratio is a ratio between said first voltage and said reference voltage;
and
means for fine-controlling said internal voltage in accordance with bit data during an operation other than said test.

1 more element

A semiconductor integrated circuit comprising:

a voltage comparing part which compares a predetermined voltage with a reference voltage;
an internal voltage generating part which generates an internal voltage on the basis of an output of said voltage comparing part;
and
a divided resistance part which potential-divides into said predetermined voltage by dividing an internal voltage node with resistance,
wherein said semiconductor integrated circuit has a test mode for determining an internal resistance value by supplying a desired trimming voltage from the outside to an external terminal connected to a first node which is a node between said internal voltage generating part and said divided resistance part.

2 more elements

Dependencies are inferred from the claim text.

Semiconductor integrated circuit

Life of this patent

Semiconductor integrated circuit

Life of this patent

Abstract

Claims18