Semiconductor tester, semiconductor integrated circuit and semiconductor testing method
AssigneeSharp Kabushiki Kaisha
InventorHiroyuki Toyoda
Life of this patent
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Abstract
The voltage output terminals of a semiconductor integrated circuit are connected to the first ends of resistors while the second ends of the resistors are connected to a common signal line. Taking advantage that the potential of the signal line presents the mean voltage value of the voltages output from all the voltage output terminals, the deviation of the potential at each voltage output terminal from the mean value and the difference of this mean value from the ideal value are determined, whereby the suitability of the output voltage from each of the output terminals is examined.
Claims6
A semiconductor tester for checking the output voltages of a semiconductor integrated circuit having a multiple number of output terminals which output predetermined voltages, comprising:
- a judgement means which, with reference to the mean voltage value of the voltages output from all the output terminals of the semiconductor integrated circuit, judges the suitability of the output voltage from each of the output terminals.
A semiconductor integrated circuit having a multiple number of output terminals which output predetermined voltages, comprising:
- a judgement signal output means which, with reference to the mean voltage value of the voltages output from all the output terminals, outputs signals representing the suitability of the output voltages from the output terminals.
A semiconductor testing method of checking the output voltages of a semiconductor integrated circuit having a multiple number of output terminals which output predetermined voltages, comprising the step of judging the suitability of the output voltage from each of the output terminals, with reference to the mean voltage value of the voltages output from all the output terminals of the semiconductor integrated circuit.
Dependencies are inferred from the claim text.