Probe card measurement tool

A measurement tool for measuring a height of features of a probe card, comprising:

• a frame adapted to seat over the probe card and having an opening to enable overhead access to the features of the probe card, the frame having a first member with a first cooperating structure;
• a second member coupled to the frame and being moveable relative to the first member along a first axis and a second axis and having a second cooperating structure engageable with the first cooperating structure to enable the second member to be moved downward along the second axis to a preselected elevation when the second member is moved to a preselected position along the first axis, the movement of the second member along the first axis being constrained when the second member is moved to the preselected elevation;
• a meter coupled to the second member for measuring a height of a feature relative to a reference elevation, the meter having a contact surface that contacts the feature when the second member is moved to the preselected elevation;
• a biasing member to bias the second member away from the preselected elevation;
• and
• an upwardly facing surface positioned substantially at the preselected elevation to enable the second member to be moved into contact with the upwardly facing surface without contacting the feature at which point the meter may be initially set to the reference elevation.

A measurement tool for measuring a height of a plurality of pins a probe card, comprising:

• a frame adapted to seat over the probe card and having an opening to enable overhead access to the plurality of pins, the frame having a first member with a first upwardly facing opening;
• a second member coupled to the frame and being moveable relative to the first member along a first axis and a second axis, the second member and the opening being sized to enable the second member to be moved downward along the second axis to a preselected elevation when the second member is moved to a preselected position along the first axis, a portion of the second member being positioned in the opening such that the movement of the second member along the first axis being constrained when the second member is moved to the preselected elevation;
• a meter coupled to the second member for measuring a height of the plurality of pins relevative to a reference elevation, the meter having a contact surface that contacts the plurality of pins when the second member is moved to the preselected elevation;
• a biasing member to bias the second member away from the preselected elevation;
• and
• an upwardly facing surface positioned substantially at the preselected elevation to enable the second member to be moved into contact with the upwardly facing surface without contacting the feature at which point the meter may be initially set to the reference elevation.