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US 6,674,078 B2Granted
Differential contrast transmission electron microscope and method of processing data about electron microscope images
AssigneesJEOL Ltd., Kuniaki Nagayama
InventorsKuniaki Nagayama, Radostin S. Danev
Life of this patent
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Abstract
Phase manipulation is used to produce a high contrast electron microscope image. A phase plate is placed at the back focal plane of an objective lens and used to form a differential contrast image.
Claims9
A differential contrast transmission electron microscope comprising:
- an objective lens having a back focal plane;
- and
- a phase plate placed in said back focal plane for forming odd functions of contrast transfer functions of electron waves in back of said phase plate, thus obtaining a differential contrast image.
A method of observing a differential contrast image having an objective lens forming a back focal plane, said method comprising of:
- placing a phase plate in said back focal plane, said phase plate forming odd functions of contrast transfer functions of electron waves in back of said phase plate.
Dependencies are inferred from the claim text.