Preparation of thin lead samples for alpha particle emission test
AssigneeUniversity of North Dakota
InventorsGlenn I. Lykken, Berislav Momcilovic
Life of this patent
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Abstract
A method of preparing a lead sample to determine an amount of alpha particle emission. First, a thin slice is obtained from the lead source, such as by cutting the lead source using a microtome. The thin slice may be rolled to flatten any wrinkles caused by the cutting. The flattened slice is then heated to near the melting point of lead to drive the polonium atoms to the surface of the slice. The slice may be cooled down to ambient temperature in Nitrogen gas. Once so prepared, the thin slice can be tested for an amount of alpha particle emission.
Claims31
A method of preparing a lead source for testing an amount of alpha particle emission, the method comprising:
- forming a sample from the lead source having a thinness which is conducive to alpha particle emission from the sample;
- and
- heating the sample to cause a migration of alpha particles in the sample to a surface of the sample.
A method of preparing thin lead samples for testing to determine an amount of alpha particle emissions, the method comprising:
- slicing a lead sample to obtain a sample slice;
- flattening the sample slice;
- and
- heating the sample slice to drive impurities to a surface of the sample slice.
A method of determining an amount of alpha particle emission from polonium atoms in a lead source, the method comprising:
- obtaining a sample from the lead source having a thinness of less than about 15 microns;
- heating the sample to cause a migration of polonium atoms to a surface of the sample;
- and
- testing the sample to determine an alpha particle emission level.
Dependencies are inferred from the claim text.