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US 6,673,386 B2Granted
Method and apparatus for forming pattern onto panel substrate
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsDaido Komyoji, Naoko Matsuda, Akira Fukano, Katsutoshi Ogawa, Akira Kumon, Hiroyuki Naka
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Abstract
A method for forming a pattern on a surface of a panel substrate, includes electrically charging pattern-forming material particles, jetting out the electrically charged pattern-forming material particles through a nozzle by applying electrostatic force to the pattern-forming material particles to form a pattern, and fixing the pattern onto the panel substrate.
Claims47
A method for forming a pattern on a surface of a panel substrate, comprising:
- detecting a distance between a nozzle and a panel substrate;
- controlling a distance between said nozzle and said panel substrate based on the detected distance between said nozzle and said panel substrate;
- electrically charging pattern-forming material particles;
- jetting out the electrically charged pattern-forming particles through said nozzle by applying electrostatic force said pattern-forming material particles to form a pattern;
- and
- fixing the said pattern said panel substrate.
3 more elements
An apparatus for forming a pattern on a panel substrate, said apparatus comprising:
- a particle feeder for feeding electrically charged pattern-forming material particles;
- a nozzle to be positioned between said particle feeder and a panel substrate;
- a jet device for jetting out the pattern-forming material particles from said nozzle by exerting an electrostatic force to the pattern-forming material particles fed from said particle feeder;
- a detector for detecting a distance between said nozzle and the panel substrate when said nozzle is positioned between said particle feeder and the panel substrate;
- and
- a distance controller for controlling a distance between said nozzle and the panel substrate. when said nozzle is positioned between said particle feeder and the panel substrate, based on the distance detected by said detector.
3 more elements
Dependencies are inferred from the claim text.