Probe card with pyramid shaped thin film contacts
AssigneeTokyo Electron Limited
InventorKiyoshi Takekoshi
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Abstract
Disclosed is a probe card comprising a probe having at thin film-like frame-like base section formed along the lower circumferential surface of an imaginary pyramid having at least a pyramidal top portion, a contact terminal section formed along the outer circumferential surface of the top portion of the imaginary pyramid, and at least one thin film-like joining section having a predetermined shape and serving to join the contact terminal section to the base section. The probe having a triangular pyramidal or conical shape as required.
Claims5
A prove card having a plurality of probes that are brought into contact with at least one element formed on a target object to be inspected for inspecting electrical characteristics of said element, said probe comprising:
- a thin film-like base section formed along the lower circumferential surface of an imaginary pyramid having at least a pyramidal top portion;
- a contact terminal section formed along the outer circumferential surface of the top portion of said imaginary pyramid;
- and
- at least one thin film-like joining section having a predetermined shape and serving to join said contact terminal section to said base section;
- wherein said joining section of at least one of said plural probes of the probe card is shaped spiral such that the joining section extends from the base section to the contact terminal section along the outer circumferential surface of the imaginary pyramid.
Dependencies are inferred from the claim text.