Non-invasive brain function examination
AssigneeMatsushita Electric Works, Ltd.
InventorsShogo Fukushima, Kenshi Suzuki, Shuji Murakami, Ryouji Nakajima, Ichiro Fukumoto, Hisashi Uchiyama
Life of this patent
Estimating the term…
Loading patent…
AssigneeMatsushita Electric Works, Ltd.
InventorsShogo Fukushima, Kenshi Suzuki, Shuji Murakami, Ryouji Nakajima, Ichiro Fukumoto, Hisashi Uchiyama
Estimating the term…
A brain function examining apparatus and others for performing an examination of a brain function by detecting a pupillary size of a subject's pupil are provided. The brain function examining apparatus includes a light source for illuminating the pupil, a pupillary detector for detecting the pupillary size, an index calculator for calculating, based on the pupillary size detected by the pupillary detector, a subject index indicative of a characteristic of the pupil, a database for storing a base index indicative of a characteristic of the pupil that can be used as reference, and an output unit for outputting the subject index, calculated by the index calculator, and the base index stored in the database.
A brain function examining apparatus for performing an examination of a brain function by detection of a pupillary size of a subject, which apparatus comprises:
A brain function examining apparatus for performing an examination of a brain function by detection of a pupillary size of a subject, which apparatus comprises:
A brain function examining apparatus for performing an examination of a brain function for dementia by detection of a pupillary size of a subject, which apparatus comprises:
Dependencies are inferred from the claim text.