Method and configuration for verifying a layout of an integrated circuit and application thereof for fabricating the integrated circuit
AssigneeInfineon Technologies AG
InventorsAchim Rein, Martin Frerichs
Life of this patent
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AssigneeInfineon Technologies AG
InventorsAchim Rein, Martin Frerichs
Estimating the term…
With the assistance of a computer, in order to verify a layout of an integrated circuit, for one or more selected interconnection networks that are contained in the layout, the capacitance with respect to other interconnection networks contained in the layout is calculated as follows: A filter polygon is determined, which corresponds to the form of the selected interconnection network, the dimensions of the filter polygon are enlarged by a predeterminable extent relative to the dimensions of the selected interconnection networks. The portions of the other interconnection networks which overlap the filter polygon are determined, and the capacitance between the selected interconnection networks and the portions of the other interconnection networks which overlap the filter polygon is determined. In order to process large volumes of data, it is advantageous in this case to split the filter polygon into partitioning cells having a predetermined maximum dimension, for which the capacitance between the selected interconnection networks and the portions of the other interconnection networks which overlap the respective partitioning cell is then calculated.
A method for verifying a layout of an integrated circuit, which comprises:
A method for fabricating an integrated circuit, which comprises:
A configuration for using a computer to verify a layout of an integrated circuit, comprising:
Dependencies are inferred from the claim text.