Back to results
US 6,665,624 B2Granted
Generating and using calibration information
AssigneeIntel Corporation
InventorsThomas D. Simon, Rajeevan Amirtharajah
Life of this patent
Estimating the term…
Abstract
Generating and using calibration information includes using a test circuit to generate calibration information that is representative of how changes in at least one variable affect operation of a first element of a controlled circuit and using the calibration information to provide control signals to the first element and to at least one other element of the controlled circuit to adjust operation of the first element and the other element to accommodate changes in the variable.
Claims40
A system comprising:
- a conductive trace;
- a first device to drive onto the conductive trace a first symbol that encodes bits in selected properties of the symbol;
- a second device to recover the bits from the waveform transferred to the second device through an electromagnetic coupler;
- and
- a test circuit to generate calibration information that indicates how variations in at least one variable impact functionality of a first element of a controlled circuit included in the first device or the second device and using the calibration information to provide control signals to the first element and to at least one other element of the controlled circuit to adjust functionality of the first element and the other element to accommodate variations in the variable.
2 more elements
A system comprising:
- a conductive trace;
- a first device to drive onto the conductive trace a first symbol that encodes bits in selected properties of the symbol;
- a second device to recover the bits from the waveform transferred to the second device through an electromagnetic coupler;
- and
- a test circuit to generate calibration information that indicates how variations in at least one variable impact functionality of a first element of a controlled circuit included in the first device or the second device and to provide control signals to the first element and to at least one other element of the controlled circuit to adjust functionality of the first element and the other element to accommodate variations in the variable in which the first element comprises a timing generator that includes a chain of delay elements each including a current starved inverter, and the test circuit comprises a test chain of the delay elements.
2 more elements
An apparatus comprising:
- a delay-locked loop to lock on one of a plurality of values, each of the values indicating a potential clock period, based on an evaluation of a statistical distribution of the values.
An apparatus comprising:
- a delay-locked loop to generate calibration information that indicates operational dependence of a first element of a controlled circuit on at least one variable;
- and
- output nodes to provide control signals reflecting the calibration information to the first element and to at least one other element of the controlled circuit to adjust operation of the first element and the other element to adjust for changes in the variable.
Dependencies are inferred from the claim text.