Method of estimating elastic and compositional parameters from seismic and echo-acoustic data

A device for determining from measured reflection data on each trace position a plurality of parameters of a subsurface, said device comprising:

• (a) input means for inputting at least the measured reflection data and the initial subsurface parameters;
• (b) means for preprocessing the measured reflection data into a plurality of partial or full stacks;
• (c) means for specifying one or more initial subsurface parameters defining an initial subsurface model;
• (d) means for specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data;
• (e) means for calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters;
• (f) means for optimizing an objective function, comprising the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously;
• and
• (G) output means for outputting optimized subsurface parameters and preferably quality control information.