System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers

A system for measuring at least one of a Kerr effect and lubricant thickness on a first object, comprising:

• a light source for transmitting a first light signal toward a first object;
• a light beam splitter for separating from a reflected light signal that has reflected off of said first object
• a first mixed reflected polarized light signal component having a first phase and
• a second mixed reflected polarized light signal component having a different phase, wherein said first mixed reflected polarized light signal component comprises both P-polarized and S-polarized light relative to the plane of incidence of said reflected light signal, and wherein said second mixed reflected polarized light signal component comprises both P-polarized and S-polarized light relative to the plane of incidence of said reflected light signal;
• a first detector for detecting a first intensity of said first mixed reflected polarized light signal component;
• a second detector for detecting a second intensity of said second mixed reflected polarized light signal component;
• a phase determinator for determining a difference in phase between said first and second mixed reflected polarized light signal components based upon said first and second intensities;
• and
• an object characteristic determinator for determining at least one of the Kerr effect of said first object based upon said difference in phase and a thickness of a lubricant on said first object based upon said difference in phase.