Non-contact method for determining quality of semiconductor dielectrics

Abstract

A non-contact method for determining a quality of a semiconductor dielectric. The method includes depositing a charge on a dielectric to achieve a high voltage on the dielectric, measuring a voltage drop of the dielectric as a function of time, and determining a soft breakdown voltage of the dielectric from the voltage drop as a function of time. The amount of charge that is deposited may vary. For example, the charge may be deposited until a voltage that ranges from about 4 megavolts to about 16 megavolts is achieved on the dielectric. The amount of charge may also depend on the thickness of the dielectric. For example, applying a charge as a function of the thickness may include applying 4 megavolts when the thickness is about 1.2 nm or applying 16 megavolts when the thickness is about 5.0 nm.

Dependencies are inferred from the claim text.