Method and apparatus for enabling extests to be performed in AC-coupled systems
AssigneeAgilent Technologies, Inc.
InventorCharles E Moore
Life of this patent
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Abstract
A method and apparatus are provided for enabling a Joint Test Access Group (JTAG)-type EXTEST to be performed in an alternating current (AC)-coupled system in order to test one or more AC-coupled connections on a printed circuit board (PCB). Direct current (DC)-restore logic receives an AC-coupled signal that corresponds to an EXTEST test pattern output from a transmitting JTAG-compliant integrated circuit (IC), and converts the AC-coupled signal into a DC signal suitable for use by JTAG logic of a JTAG-compliant receiving IC.
Claims20
An apparatus for enabling a Joint Test Access Group (JTAG)-type EXTEST to be performed in an alternating current (AC)-coupled system in order to test one or more connections on a printed circuit board (PCB), the apparatus comprising:
- a direct current (DC)-restore logic, the DC-restore logic receiving an AC-coupled signal, the AC-coupled signal corresponding to an EXTEST test pattern output from a transmitting JTAG-compliant integrated circuit (IC), the DC-restore logic converting the AC-coupled signal into a DC signal suitable for use by JTAG logic of a JTAG-compliant receiving IC.
A method for enabling a Joint Test Access Group (JTAG)-type EXTEST to be performed in an alternating current (AC)-system in order to test one or more AC-coupled connections on a printed circuit board (PCB), the method comprising the steps of:
- providing direct current (DC)-restore logic, the DC-restore logic receiving an AC-coupled signal, the AC-coupled signal corresponding to an EXTEST test pattern output from a transmitting JTAG-compliant integrated circuit (IC);
- and
- converting the AC-coupled signal into a DC signal suitable for use by JTAG logic of a JTAG-compliant receiving IC, the AC-coupled signal being converted by the DC-restore logic.
Dependencies are inferred from the claim text.