Particle analyzer and particle classifying method
AssigneeSysmex Corporation
InventorTakamichi Naito
Life of this patent
Estimating the term…
Loading patent…
AssigneeSysmex Corporation
InventorTakamichi Naito
Estimating the term…
A particle analyzer includes a detecting section for detecting at least two kinds of parameters from a plurality of particles included in a sample, the two kinds of parameters representing characteristics of each particle, a processing section for processing the parameters detected by the detecting section; and an output section for outputting a result processed by the processing section, wherein the processing section includes a distribution chart creating section for creating a scattergram of the particles based on the detected parameters, a region presetting section for presetting a particle distribution region in the created scattergram, and a classifying section for calculating a classifying line corresponding to a particle distribution state in the preset particle distribution region and for classifying the particles on the scattergram by the calculated classifying line.
A particle analyzer comprising:
A particle analyzer comprising:
Dependencies are inferred from the claim text.