Testing device for testing a memory
AssigneeInfineon Technologies AG
InventorsCarsten Ohlhoff, Peter Pöchmüller
Life of this patent
Estimating the term…
Abstract
A substrate includes a memory and a testing device for testing the memory. The testing device includes an interpreter element that operates and tests the memory in accordance with a test program. The test program command codes are stored in the untested memory cell array of the memory that will be tested. The advantage of the testing device consists, inter alia, in the fact that the testing device no longer needs to be adapted to changed hardware properties of the chip generation or fabrication lines because the test program, which is suitable for the respective chip type, is stored as a variable code on the respective memory which is to be tested. It is thus also possible to test various memory chip types with the same testing device.
Claims20
A testing device in combination with a substrate having a memory to be tested, wherein:
- the memory including a plurality of memory cells formed in a memory cell array;
- the memory storing a test program;
- the memory being formed at the substrate;
- and
- said testing device including an interpreter element operating and testing the memory in accordance with the test program stored in said memory cell array.
Dependencies are inferred from the claim text.