A method of using a microscope comprising an illuminator having a through opening, an objective lens, and a radiant energy source associated with the microscope, said microscope being configured for observing a specimen by reflected light microscopy, the method comprising the steps of:
- positioning said illuminator on a same side of said specimen as said objective lens relative to a plane of said specimen normal to a main axis of said objective lens;
- stimulating said illuminator by a radiant energy having a first frequency;
- using at least one scattering particle to change said radient energy having a first frequency to light at a second frequency;
- emitting the light at a second frequency from said illuminator;
- and
- illuminating said specimen by the light emitted from said illuminator at a second frequency in response to said stimulating by said radiant energy.