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US 6,661,511 B2Granted
Method and apparatus for enhanced laser-induced plasma spectroscopy using mixed-wavelength laser pulses
AssigneeNational Research Council of Canada
InventorsVincent Detalle, Louis St-Onge, Mohamad Sabsabi
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Abstract
A sample of heterogeneous material is analyzed by directing a mixed-wavelength laser pulse at the sample to produce a plasma. The mixed wavelength pulse contains both shorter and longer wavelength components. The composition of the material is determined from the emission spectrum of the plasma.
Claims18
A method of analyzing the composition of heterogeneous materials comprising:
- providing a sample of a material to be analyzed;
- directing a mixed-wavelength laser pulse at said sample to produce a plasma;
- and
- determining the composition of said material from the emission spectrum of said plasma.
1 more element
A method of analyzing the composition of heterogeneous materials comprising:
- providing a sample of a material to be analyzed;
- directing a mixed-wavelength laser pulse having one or more relatively shorter wavelength components that are initially well absorbed by the material to vaporize the material into a plasma and produce seed electrons and one or more relatively longer wavelength components that are absorbed in said plasma and induce plasma shielding;
- and
- determining the composition of said material from the emission spectrum of said plasma.
1 more element
An apparatus for use in the analysis of heterogeneous materials comprising:
- at least one laser for generating a mixed-wavelength pulsed laser beam;
- and
- a focusing arrangement for focusing said mixed wavelength laser beam onto a sample to produce a plasma;
- and
- a spectrum analyzer determining the composition of said material from the emission spectrum of said sample.
2 more elements
Dependencies are inferred from the claim text.