Constant-current VDDQ testing of integrated circuits
AssigneeAdvanced Micro Devices, Inc.
InventorGlen Patrick Gilfeather
Life of this patent
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Abstract
Integrated circuit analysis is enhanced via a method and system for detecting defects associated with particular logic states of an integrated circuit. According to an example embodiment of the present invention, a constant current supply is applied to an integrated circuit. The voltage across the constant current supply is detected for each of a plurality of clock cycles of the integrated circuit, each clock cycle being representative of a logic state of the integrated circuit. The voltage detected at each clock cycle is compared, and the comparison is used to analyze the integrated circuit for a defect.
Claims29
A method for analyzing an integrated circuit, the method comprising:
- applying a constant current supply to the integrated circuit;
- detecting a voltage across the constant current supply for each of a plurality of clock cycles of the integrated circuit, each clock cycle being representative of a logic state of the integrated circuit;
- and
- detecting a defect in the device as a detected voltage at a clock cycle that is sufficiently different than a detected voltage at a different clock cycle.
A method for analyzing an integrated circuit, the method comprising:
- applying a constant current supply having a selected current level to a non-defective integrated circuit;
- detecting a reference voltage across the constant current supply for a known state of the non-defective circuit;
- applying a constant current supply at the selected current level to a defective integrated circuit;
- detecting a test voltage across the constant current supply at the defective integrated circuit for at least one clock cycle of the defective integrated circuit;
- and
- comparing the test voltage to the reference voltage and detecting a defect at the defective integrated circuit as a variation between the test voltage and the reference voltage.
A system for analyzing an integrated circuit, the system comprising:
- means for applying a constant current supply to the integrated circuit;
- means for detecting a voltage across the constant current supply for each of a plurality of clock cycles of the integrated circuit, each clock cycle being representative of a logic state of the integrated circuit;
- means for detecting a defect in the device as a detected voltage at a clock cycle that is sufficiently different than a detected voltage at a different clock cycle.
A system adapted to analyze an integrated circuit, the system comprising:
- a power supply adapted to apply a constant current supply to the integrated circuit;
- a voltage detector adapted to detect a voltage across the power supply for each of a plurality of clock cycles of the integrated circuit, each clock cycle being representative of a logic state of the integrated circuit;
- a comparator adapted to compare the voltage detected at each clock cycle;
- and
- an evaluation arrangement adapted to use the voltage comparison for analyzing the integrated circuit for a defect.
Dependencies are inferred from the claim text.