Method to eliminate wiring of electrical fixtures using spring probes
AssigneeInternational Business Machines Corporation
InventorsRobert J. Reis, Harold M. Buettner
Life of this patent
Estimating the term…
Abstract
Electrical contact to a probe receptacle in a test fixture is provided by fitting the probe receptacle with a compliant pin and inserting the compliant pin into a plated through hole in an interface printed circuit board. The plated through hole is electrically connected to a test interface region on the printed circuit board. The compliant pin provides both electrical contact to and mechanical retention of the interface printed circuit board.
Claims20
A method of providing electrical contact in a test fixture, comprising:
- fitting a spring probe receptacle for a spring probe with a compliant pin;
- and
- inserting the complaint pin into a plated through hole in an interface printed circuit board, wherein electrical contact between the spring probe receptacle and the interface printed circuit board is provided.
A probe receptacle contact structure in a test fixture, comprising:
- at least one spring probe receptacle having a complaint pin at one end;
- and
- an interface board having at least one plated through hole, wherein the complaint pin is received and retained by the at least one plated through hole.
A spring probe receptacle contact structure, comprising:
- a spring probe receptacle adapted to receive a spring probe within an interval cavity through an opening at one end and having a complaint pin fitted within and protruding from an opening in an opposite end.
Dependencies are inferred from the claim text.