Nickel alloy probe card frame laminate

A probe head assembly suitable for use in a vertical pin probing device, comprising:

• a first spacer member having a first innermost surface and a first outermost surface and a centrally disposed first aperture, a first dielectric sheet spanning said first aperture adjacent said first outermost surface, said first dielectric sheet having a first set of through-holes defining a pattern;
• a second spacer member having a second innermost surface and a second outermost surface and a centrally disposed second aperture, a second dielectric sheet that is substantially parallel to said first dielectric sheet spanning said second aperture adjacent said second outermost surface, said second dielectric sheet having a second set of through holes defining said same pattern but horizontally off-set from vertical alignment with said first set of through holes, wherein said second innermost surface is adjacent said first innermost surface;
• and
• at least one of said first spacer member and said second spacer member being a composite formed of a plurality of lamination layers of a low coefficient of thermal expansion metal alloy foil laminated together wherein at least a first lamination layer and a second lamination layer have non-aligned elongated metallic grains.