Using a DUT pin at known voltage to determine channel path resistance in automated test equipment test channels

Abstract

A method for determining contact resistance between an automated test equipment (ATE) system and a device under test (DUT). The DUT is configured to drive a known voltage to a pin. The ATE system is then controlled to force a first test current into the DUT at that pin. A board precision measurement unit (BPMU) of the ATE system then measures the voltage VM+ required to force the first test current. The ATE system is then controlled to force a second test current to flow out of the DUT at the same pin. The ATE system controls the second test current to have the same magnitude (but opposite direction) as the first test current. The BPMU then measures the voltage VM− required to force the second test current. The contact resistance is then determined in response to the measured voltages VM+ and VM−, and the magnitude of the test current.

Dependencies are inferred from the claim text.