Method and apparatus for adjusting characteristics of multi electron source
AssigneeCanon Kabushiki Kaisha
InventorsShuji Aoki, Takahiro Oguchi
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AssigneeCanon Kabushiki Kaisha
InventorsShuji Aoki, Takahiro Oguchi
Estimating the term…
A method for adjusting electron emitting characteristics of a multi-electron source having plural electron emitting devices disposed on a substrate. The method comprises measuring electron emission characteristics of the devices and setting a characteristic adjustment target value. Plural characteristic shift voltages having discrete values are applied to some of the devices, electron emission characteristics of each of these devices are measured, and a characteristic adjustment table is generated for each characteristics shift voltage value according to change rates of these measured characteristics. A predetermined characteristics shift voltage value is selected based on the corresponding table, and that voltage is applied to the devices to cause their characteristics to shift towards the target value. A change in the electron emission characteristics is monitored to revise the characteristics shift condition.
A characteristics adjustment method for a multi electron source having a plurality of electron emitting devices disposed on a substrate, comprising steps of:
A characteristics adjustment apparatus for adjusting electron emission characteristics of each of a plurality of electron emitting devices disposed on a substrate of a multi electron source, comprising:
Dependencies are inferred from the claim text.