Semiconductor device and method of fabricating the same
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorKatsumi Nakamura
Life of this patent
Estimating the term…
Abstract
A gate electrode <13> is provided to fill up a trench <300> while covering its opening. Assuming that WG represents the diameter (sectional width) of a head portion of the gate electrode <13> located upward beyond a P-type base layer <4> and an N+-type emitter diffusion layer <51>, WT represents the diameter (sectional width) of an inner wall of a linearly extending portion of the trench <300> and WC represents the distance between the boundary (the inner wall of the trench 300) between a gate oxide film <11> and the P-type base layer <4> and an end surface of the gate electrode <13> located upward beyond the trench <300> in a section of the trench <300>, relation of either WG≧1.3·WT or WC≧0.2 μm holds between these dimensions.
Claims3
A semiconductor device comprising:
- a semiconductor substrate having a main surface;
- a trench having an opening on said main surface and a bottom portion in said semiconductor substrate respectively;
- an insulating film being provided on an inner wall of said trench and a portion of said main surface around said opening;
- and
- a conductive material film being provided oppositely to said semiconductor substrate through said insulating film and having, a head portion being farther from said bottom portion of said trench measured from said main surface,
- an end surface of said head portion being separated from said opening of said trench than said inner wall by at least 0.2 μm.
A semiconductor device comprising:
- a semiconductor substrate;
- a gate electrode configured as a gate for a channel which is formed in a thickness direction of said semiconductor substrate, where a main current flows in the channel in an operating state;
- a first conductive layer provided over said gate electrode and configured as an interconnect line;
- and
- a second conductive layer, intervening between said gate electrode and said first conductive layer at least immediately above said gate electrode and having higher strength than said first conductive layer.
Dependencies are inferred from the claim text.