Method and apparatus for measuring a low power signal
AssigneeAgilent Technologies, Inc.
InventorsVolker Brombacher, Fritz Bek
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorsVolker Brombacher, Fritz Bek
Estimating the term…
Low intensity light is incident upon a photodiode whose output is coupled to an integrator. The output of the integrator is coupled to an input of an A/D converter, whose output is coupled to a microprocessor, whose output is coupled to a filter. A second output of the microprocessor is coupled to a gate electrode of a FET to provide a reset signal to the FET to reset the integrator. The microprocessor compares the digital samples of the integrated signal from the A/D converter and, firstly, generates the reset signal if a sample is beyond a set limit, and, secondly, calculates delta values between adjacent samples and interpolates the delta values for the reset periods so as to provide a continuous data stream which can be filtered by a filter matched to the form of the original signal.
A method of measuring a low power signal, comprising:
An apparatus for measuring a low power signal, comprising:
Dependencies are inferred from the claim text.