Method of manufacturing a semiconductor device using laser irradiation
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsKoichiro Tanaka, Shunpei Yamazaki
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsKoichiro Tanaka, Shunpei Yamazaki
Estimating the term…
According to a structure of the present invention disclosed in this specification, there is provided a laser irradiation apparatus, characterized by including: a plurality of lasers; a unit for controlling oscillation of the plurality of lasers; a unit for synthesizing a plurality of laser lights emitted from the plurality of lasers into a laser light; a unit for condensing the laser light on an irradiation surface or in the vicinity of the irradiation surface; and a unit for moving the laser light at least in one direction. Laser light irradiation is performed to a semiconductor film by using the above-described laser irradiation apparatus, whereby crystallization of the semiconductor film and activation of an impurity element can be performed.
A laser irradiation method comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A laser irradiation method comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.