Method for forming a semiconductor device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorHongyong Zhang
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Abstract
A method for forming a semiconductor device is disclosed. The method comprises the step of irradiating a laser light to a surface of a semiconductor through a mask provided on said surface in an atmosphere comprising an impurity of one conductivity type to diffuse said impurity into a region of said semiconductor.
Claims37
A method for forming a semiconductor device comprising the steps of:
- preparing a substrate having a semiconductor film thereover;
- crystallizing said semiconductor film by irradiating a laser light thereto;
- introducing said substrate to a chamber for introducing a dopant impurity to the crystalline semiconductor film;
- preparing an atmosphere comprising a dopant gas diluted with hydrogen wherein said dopant gas comprises a compound of said dopant impurity;
- converting said atmosphere to a plasma by applying an electrical energy thereto;
- and
- introducing said dopant impurity into the crystalline semiconductor film by using said plasma.
A method for forming a semiconductor device comprising the steps of:
- forming a semiconductor film on an insulting surface by a CVD using a silane which is not diluted with hydrogen, as a reactive gas;
- crystallizing said semiconductor film by irradiating a laser light thereto;
- preparing an atmosphere comprising a dopant gas diluted with hydrogen wherein said dopant gas comprises a compound of a dopant impurity;
- converting said atmosphere to plasma by applying an electrical energy thereto;
- and
- introducing said dopant impurity into the crystalline semiconductor film by using said plasma.
A method for forming a semiconductor device comprising the steps of:
- forming a semiconductor film on an insulating surface by a CVD using a silane which is not diluted with hydrogen, as a reactive gas;
- crystallizing said semiconductor film;
- preparing an atmosphere comprising a dopant gas diluted with hydrogen gas wherein said dopant gas comprises a compound of a dopant impurity;
- converting said atmosphere to a plasma by applying an electrical energy thereto and
- introducing said dopant impurity into the crystalline semiconductor film by using said plasma.
A method for forming a semiconductor device comprising a steps of:
- forming a semiconductor film comprising amorphous silicon and hydrogen on an insulting surface;
- drawing hydrogen out of said semiconductor film;
- crystallizing said semiconductor film;
- preparing an atmosphere comprising a dopant gas diluted with hydrogen wherein said dopant gas comprises a compound of a dopant impurity including a trivalent or a pentavalent atom;
- converting said atmosphere to a plasma by applying an electrical energy thereto;
- and
- introducing said dopant impurity into the crystalline semiconductor film by using said plasma.
A method for forming a semiconductor device having a semiconductor island including at least source and drain regions, a channel region therebetween, and a gate electrode adjacent to said semiconductor island, said method comprising the steps of:
- forming a semiconductor film on an insulating surface;
- crystallizing said semiconductor film;
- patterning the crastalline semiconductor film into said semiconductor island;
- preparing an atmosphere comprising a dopant gas diluted with hydrogen wherein said dopant gas comprises a compound of a dopant impurity;
- converting said atmosphere to a plasma by applying an electrical energy thereto;
- and
- introducing said dopant impurity into selected portions of the semiconductor island to form said source and drain regions by using said plasma.
The method for forming a semiconductor device having a semiconductor island including at least source and drain regions, a channel region therebetween, and a gate electrode adjacent to said semiconductor island, said method comprising the steps of:
- forming a semiconductor film on an insulting surface;
- crystallizing said semiconductor film by irradiating a laser light thereto;
- patterning the crystalline semiconductor film into said semiconductor island;
- preparing an atmosphere comprising a dopant gas wherein said dopant gas comprises a compound of a dopant impurity;
- converting said atmosphere to a plasma by applying an electrical energy thereto;
- and
- introducing said dopant impurity into selected portions of the semiconductor island to form said source and drain regions by using said plasma.
A method for forming a semiconductor device having a semiconductor island including at least source and drain regions, a channel region therebetween and a gate electrode adjacent to said semiconductor island, said method comprising the steps of:
- forming a semiconductor film on an insulating surface by a CVD using a silane which is not diluted with hydrogen, as a reactive gas;
- crystallizing said semiconductor film;
- patterning the crystalline semiconductor film into said semiconductor island;
- preparing an atmosphere comprising a dopant gas diluted with the hydrogen gas wherein said dopant gas comprises a compound of a dopant impurity;
- converting said atmosphere to a plasma by applying an electrical energy thereto;
- and
- introducing said dopant impurity into selected portions of the semiconductor island to form said source and drain regions by using said plasma.
A method for forming a semiconductor device having a semiconductor island including at least source and drain regions, a channel region therebetween and a gate electrode adjacent to said semiconductor island, said method comprising the steps of:
- forming a semiconductor film comprising amorphous silicon and hydrogen on an insulating surface;
- drawing hydrogen out of said semiconductor film;
- crystallizing said semiconductor film;
- patterning the crystalline semiconductor film into said semiconductor island;
- preparing an atmosphere comprising a dopant gas diluted with hydrogen wherein said dopant gas comprises a compound of dopant impurity including a trivalent or a pentavalent atom;
- converting said atmosphere to a plasma by applying an electrical energy thereto;
- and
- introducing said dopant impurity into selected portion of the semiconductor island to form said source and drain regions by using said plasma.
Dependencies are inferred from the claim text.