Thin film semiconductor device and method for producing the same
AssigneeSeiko Epson Corporation
InventorMitsutoshi Miyasaka
Life of this patent
Estimating the term…
Loading patent…
AssigneeSeiko Epson Corporation
InventorMitsutoshi Miyasaka
Estimating the term…
In order to fabricate a high performance thin film semiconductor device using a temperature process in which it is possible to use inexpensive glass substrates, a highly crystalline mixed-crystallinity semiconductor film is deposited by means of PECVD using a silane as the source gas and argon as the dilution gas, then the crystallinity of this film is improved by such means as laser irradiation. Thin film semiconductor devices fabricated in this way are used in the manufacture of such things as liquid crystal displays and electronic devices. In applying the present invention to the fabrication of an active matrix liquid crystal display, it is possible to both easily and reliably fabricate a large, high-quality liquid crystal display. Additionally, in applying the present invention to the fabrication of other electronic circuits as well, it is possible to both easily and reliably fabricate high-quality electronic circuits.
A process for depositing a thin film over a substrate by plasma-enhanced chemical vapor deposition (PECVD), the process comprising:
A process for depositing a thin film over a substrate by plasma-enhanced chemical vapor deposition (PECVD), the process comprising:
A process for depositing a thin film over a substrate by plasma-enhanced chemical vapor deposition (PECVD), the process comprising:
A process for producing a display, comprising:
A process for producing a display, comprising:
A process for producing a display, comprising:
A process for producing an electronic device, comprising:
A process for producing an electronic device, comprising:
A process for producing an electronic device, comprising:
Dependencies are inferred from the claim text.