Method of making ferroelectric material utilizing anneal in an electrical field
AssigneesSymetrix Corporation, Matsushita Electric Industrial Co., Ltd.
InventorsKiyoshi Uchiyama, Carlos A. Paz de Araujo
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AssigneesSymetrix Corporation, Matsushita Electric Industrial Co., Ltd.
InventorsKiyoshi Uchiyama, Carlos A. Paz de Araujo
Estimating the term…
A ferroelectric thin film precursor material is annealed while in an electric field. The electric field is maintained as the material cools. A partially completed integrated circuit with a ferroelectric thin film precursor material may be placed between two electrodes in an annealing apparatus and voltage sufficient to polarize the ferroelectric thin film material in the direction of the electrical field is supplied to the electrodes during the anneal and as the film cools. Alternatively, probes are connected to the electrodes of a partially completed integrated circuit device and voltage sufficient to polarize the ferroelectric material is applied while annealing the material and as it cools. The anneal may be a furnace anneal or an RTP anneal.
A method of fabricating an integrated circuit, said method comprising the acts of:
A method of fabricating an integrated circuit, said method comprising the acts of:
Dependencies are inferred from the claim text.