Optical equipment assemblies and techniques indexed to a common spindle
AssigneeSeagate Technology LLC
InventorsJoseph Leigh, David S. Kuo, Li-Ping Wang, Nobuo Kurataka
Life of this patent
Estimating the term…
Loading patent…
AssigneeSeagate Technology LLC
InventorsJoseph Leigh, David S. Kuo, Li-Ping Wang, Nobuo Kurataka
Estimating the term…
A method and apparatus for scanning a media is described. More particularly, polarization detector and an atomic force microscope are coupled to a common platform indexed to a spindle. Optionally, an optical microscope may be coupled to the common platform. The polarization detector is used to detect a magnetic image, such as at least a portion of a servo pattern, of the media, and the atomic force microscope, which may be aligned using the magnetic image, is used with a magnetic microscopy module to scan the media. Accordingly, magnetic imagery may be achieved with indexing to a single spindle for positional consistency as between equipment. Moreover, the polarization detector may further be configured to detect scattered light for providing topographic imagery of the media.
An apparatus for metrology on a media, comprising:
A method for scanning a media, comprising:
An apparatus for scanning a media, comprising:
Dependencies are inferred from the claim text.