Method of fabricating a ferroelectric stacked memory cell
AssigneeSTMicroelectronics S.r.l.
InventorsChiara Corvasce, Raffaele Zambrano
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AssigneeSTMicroelectronics S.r.l.
InventorsChiara Corvasce, Raffaele Zambrano
Estimating the term…
The cells of the stacked type each comprise a MOS transistor formed in an active region of a substrate of semiconductor material and a capacitor formed above the active region; each MOS transistor has a first and a second conductive region and a control electrode and each capacitor has a first and a second plate separated by a dielectric region material, for example, ferroelectric one. The first conductive region of each MOS transistor is connected to the first plate of a respective capacitor, the second conductive region of each MOS transistor is connected to a respective bit line, the control electrode of each MOS transistor is connected to a respective word line, the second plate of each capacitor is connected to a respective plate line. The plate lines run perpendicular to the bit line and parallel to the word lines. At least two cells adjacent in a parallel direction to the bit lines share the same dielectric region material. In this way, the manufacturing process is not critical and the size of the cells is minimal.
A process for manufacturing a memory array formed of a large number of stacked cells, comprising:
A process for forming a memory array, comprising:
A process for making a memory array, comprising:
A process for making a memory array, comprising:
A process for making a memory array, comprising:
Dependencies are inferred from the claim text.