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US 6,655,196 B2Granted
Scanning probe microscope
AssigneeHokkaido University
InventorsKoichi Mukasa, Kazuhisa Sueoka, Naoki Kamo, Hirotaka Hosoi, Makoto Sawamura
Life of this patent
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Abstract
At the forefront of a probe is formed a carbon nanotube having an armchair type crystal structure or of which the forefront is chemically modified with modifying molecules.
Claims13
A scanning probe microscope comprising:
- a cantilever,
- a probe formed on said cantilever, and
- a carbon nanotube of which a forefront is chemically modified and substituted with metallic complex molecules containing transition metal elements and which is formed at a forefront of said probe.
A scanning probe microscope comprising:
- a cantilever,
- a probe formed on said cantilever, and
- a carbon nanotube of which a forefront is chemically modified and substituted with radical molecules and which is formed at a forefront of said probe.
A scanning probe microscope comprising:
- a cantilever,
- a probe formed on said cantilever, and
- a carbon nanotube of which a forefront is chemically modified and substituted with modifying molecules and which is formed at a forefront of said probe, wherein said forefront of said carbon nanotube is modified by conveying said modifying molecules to said forefront of said carbon nanotube with an optical tweezer, and chemically reacting said modifying molecules to said forefront of said carbon nanotube.
A scanning probe microscope comprising:
- a cantilever,
- a probe formed on said cantilever,
- a carbon nanotube having an armchair type crystal structure and electric conduction property which is formed at a forefront of said probe, and
- a spin polarization electron beam source which is connected to said carbon nanotube.
1 more element
Dependencies are inferred from the claim text.