Fixed beam high-g shock pulse generator apparatus and method
AssigneeHoneywell International Inc.
InventorsOwen D. Grossman, Mark W. Weber, Jeffrey E. Fridberg
Life of this patent
Estimating the term…
Abstract
An apparatus and method for use in testing devices under high-g environments is disclosed in which an elastic beam, rigidly fastened at least at one end, carries the device under test; the beam being pre-loaded to a bent position by a force producing member which may be suddenly removed to allow the stored energy of the beam to be released, and to apply a high-g force to the device.
Claims20
A high-g shock-producing device for testing a sample specimen comprising:
- a beam of predetermined length having at least one end substantially rigidly fixed with the specimen mounted thereon at a position remote from the one end;
- a device positioned to apply a force causing the beam to bend in a direction transverse to the length;
- and
- means for suddenly removing the force so as to release the beam and produce a high-g shock on the specimen.
The method of producing a high-g force on a test device comprising the steps of:
- A) mounting a beam rigidly at least at one end;
- B) mounting the device on the beam at a position remote from the one end;
- C) applying a force to the beam in a direction to bend the beam by a predetermined amount;
- and
- D) suddenly removing the force to release the beam, to produce a high-g force on the device.
A high-g shock producing device for testing a specimen comprising:
- an I-beam of high strength aluminum mounted rigidly at both ends;
- means for mounting the specimen atop the I-beam proximate the center thereof;
- a ceramic member positioned to bear against the bottom of the I-beam proximate the center;
- a hydraulic ram positioned to produce an upwardly directed force on the ceramic member to cause the I-beam to bend to a position below the yield point thereof;
- a projectile shooting device positioned to direct a projectile at the ceramic member to cause it to fracture and remove the upwardly directed force thereby allowing the I-beam to suddenly un-bend and apply a high-g force to the specimen.
Dependencies are inferred from the claim text.