Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices

A multiport test set that characterizes a multiterminal DUT, comprising:

• a plurality of ports;
• a signal generator that provides a test signal over a frequency range;
• a switching device, coupled between the signal generator, the plurality of ports of the multiport test set and at least on test channel receiver, that couples the test signal to any port of the multiport test set and to the at least one test channel receiver;
• a reference receiver, coupled to the signal generator, that measures the test signal to determine a reference value;
• the at least one test channel receiver that can measure the test signal at each port of the multiport test set;
• means for determining S-parameters [S] of the DUT from the test signal measurements at each port of the multiport test set with the at least one test channel receiver, and from the reference value;
• means for determining elements of a scalar orthogonal matrix [M] corresponding to a number of terminals of the DUT and modes of operation of the DUT wherein matrix elements in said scalar orthogonal matrix represent at least one single-ended terminal of said DUT and matrix elements of said scalar orthogonal matrix represent at least one balanced terminal pair of said DUT;
• and
• means for transforming the S-parameters [S] of the DUT into mixed-mode S-parameters [Smm] according to a transformation [Smm]=MSM−1.

A method of characterizing a DUT, comprising the steps of:

• calibrating a multiport test set;
• coupling each terminal of the DUT to a port of the multiport test set;
• measuring S-parameters of the DUT with the multiport test set;
• converting the S-parameters to a time domain representation;
• convolving at least one of said converted S-parameters with a simulated input signal to generate an output response;
• and
• presenting said output response.

A multiport test set that characterizes a multiterminal DUT, comprising:

• a plurality of ports;
• a signal generator that provides a test signal over a frequency range;
• a switching device, coupled between the signal generator, the plurality of ports of the mutliport test set and at least one test channel receiver, that couples the test signal to any port of the multiport test set and to the at least one test channel receiver;
• a reference receiver, coupled to the signal generator, that measures the test signal to determine a reference value;
• the at least one test channel receiver, that measures the test signal at each port of the multiport test set;
• means for determining S-parameters [S] of the DUT from the test signal measurements at each port of the multiport test set and the reference value;
• a conversion element for converting the S-parameters to a time-domain representation;
• a computational element for convolving at least one of said converted S-parameters with a simulated input signal to generate an output response;
• and
• a display for presenting said output response.

A method of characterizing a DUT, comprising the steps of:

• calibrating a multiport test set;
• coupling each terminal of the DUT to a respective port of the multiport test set;
• measuring S-parameters [S] of the DUT with the multiport test set, said DUT having at least three balanced terminals;
• determining elements of a scalar orthogonal matrix [M] corresponding to terminals of the DUT and DUT modes of operation wherein said scalar orthogonal matrix [M] comprises matrix elements representing a respective one of said balanced terminals;
• and
• transforming the S-parameters of the DUT into mixed-mode S-parameters [Smm] according to a transformation Smm=MSM−1.