Built-in self repair circuitry utilizing permanent record of defects

A method for providing fault information to an integrated circuit for purposes of performing built-in self repair, the integrated circuit having a built-in self test circuit, a built-in self repair circuit and a non-volatile storage circuit capable of providing repair information to the built-in self repair circuit, the method comprising the steps of:

• applying a stress factor(s) to the integrated circuit;
• performing a built-in self test analysis to detect faults in a predetermined portion of the integrated circuit;
• generating fault information pertaining to any defects detected by the built-in self test analysis;
• providing the fault information to the non-volatile storage circuit;
• applying a second stress factor(s) to the integrated circuit;
• performing a second built-in self test analysis on the predetermined portion of the integrated circuit;
• generating second fault information pertaining to any faults detected by the second built-in self test analysis;
• and
• providing the second fault information to the non-volatile storage circuit.

A method for providing fault information to an integrated circuit and performing corresponding built-in self repair operations, the integrated circuit having a built-in self test circuit, a built-in self repair circuit and a non-volatile storage circuit capable of providing repair information to the built-in self repair circuit, the method comprising the steps of:

• applying at least one set of stress factor(s) to the integrated circuit;
• performing a built-in self test analysis for each set of stress factor(s) to detect faults in a predetermined portion of the integrated circuit die;
• generating a set of fault information pertaining to defects detected by each built-in self test analysis executed on the integrated circuit die;
• providing the fault information to the non-volatile storage circuit;
• incorporating the integrated circuit in a circuit board or end product;
• communicating the fault information from the non-volatile storage circuit to the built-in self repair circuit, wherein the built-in self repair circuit utilizes the fault information to perform repair operations on the predetermined portion of the integrated circuit.

A method for providing fault information to an integrated circuit for purposes of performing built-in self repair, the integrated circuit having a built-in self test circuit, a built-in self repair circuit and a non-volatile storage circuit capable of providing repair information to the built-in self repair circuit, the method comprising the steps of:

• applying a stress factor(s) to the integrated circuit;
• performing a built-in self test analysis to detect faults in a predetermined portion of the integrated circuit;
• generating fault information pertaining to any defects detected by the built-in self test analysis;
• providing the fault information to the non-volatile storage circuit;
• and
• applying a second stress factor(s) to the integrated circuit.