Semiconductor memory device, and method for testing the same
AssigneeHynix Semiconductor Inc.
InventorsSang Hoon Hong, Si Hong Kim
Life of this patent
Estimating the term…
Abstract
A semiconductor memory device and a method for testing the same which optimizes operation conditions by detecting a test cell that may easily fail in a test among the memory cells passing a burn-in test, and detecting the worst operation conditions by performing the test on the test cell. The device and method reduce power consumption in a refresh or active operation. According to the device and method set forth, a test unit tests a test cell, controls operation conditions of the semiconductor memory device according to the test result, and outputs the operation conditions. A driving unit drives the semiconductor memory device using the operation conditions controlled by the test unit.
Claims17
A semiconductor memory device comprising:
- a memory cell array comprising a test cell determined as a worst one among the memory cells passing a first test;
- a test unit for performing a second test on the test cell in predetermined operation conditions, repeatedly performing the second test after adjusting the operation conditions of the test cell according to the result of the second test and finally outputting the final operation conditions;
- and
- a driving unit for driving the memory cell array by using the final operation conditions from the test unit.
A method for testing a semiconductor memory device, comprising:
- detecting a test cell which may easily fail among the cells passing a first test, repairing the test cell, and memorizing an address of the test cell;
- a test step for performing a second test on the test cell in predetermined operation conditions by using the address of the test cell;
- returning to the test step after adjusting the operation conditions, when the test cell passes the second test;
- and
- providing the operation conditions used in the second test as driving conditions of a memory cell array, when the test cell fails in the second test.
Dependencies are inferred from the claim text.