ESD protection by a high-to-low resistance shunt

An assembly for providing electrical protection to a thin film sensor, the assembly comprising:

• a thin film sensor assembly including the thin film sensor, and first and second electrical contacts in electrical communication with the sensor;
• a shunting structure deposited between and in electrical communication with the first and second electrical contacts, wherein the shunting structure as initially deposited is a high resistance path between the first and second electrical contacts and does not electrically short the first and second electrical contacts, and wherein, when the shunting structure is heat treated, the shunting structure thereafter becomes a low resistance path between the first and second electrical contacts to provide protection of the thin film sensor assembly from damaging electrical transients.

An apparatus for electrically protecting a thin film sensor, the apparatus comprising:

• a thin film sensor assembly including the thin film sensor and a first electrical contact and a second electrical contact, the first and second electrical contacts in electrical communication with the thin film sensor;
• and
• means for shunting the Thin film sensor to protect the thin film sensor from damaging electrical transients, the shunting means including a shunting structure deposited in electrical communication with the first and second electrical contacts, wherein the shunting structure is initially deposited as a high resistance path between the first and second electrical contacts and wherein the shunting structure becomes a low resistance path between the first and second electrical contacts upon heating of the shunting structure.