Multi-wavelength etalon
AssigneeAgere Systems Inc.
InventorStephen O'Brien
Life of this patent
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Abstract
A multi-wavelength etalon comprises at least two regions with different indices of refraction. The change in refractive index alters the wavelengths of incident light, and thus the number of wavelengths between the reflective surfaces of the etalon, and therefore the etalon's transmission characteristics. By selecting specific indices of refraction, an etalon can be provided which produces peaks and troughs at preselected wavelengths in each region. The transition between two adjacent regions with different indices of refraction can be graded to reduce optical interference which may result from an abrupt transition.
Claims5
A method for fabricating a multi-wavelength etalon comprising the steps of:
- (a) forming an ingot having a first horizontal layer with a first index of refraction and a second horizontal layer with a second index of refraction different from the first index of refraction;
- (b) cutting at least one vertical slab of approximately a predefined thickness from the ingot, each slab having first and second vertical sides;
- and
- (c) polishing the first and second vertical sides to an optical flatness, wherein at the termination of the polishing step a multi-wavelength etalon is formed.
Dependencies are inferred from the claim text.