Display device test procedure and apparatus
AssigneeAurora Systems, Inc.
InventorWilliam K. Zuravleff
Life of this patent
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Abstract
A test method (80) for testing a reflective LCD array (10) and apparatus including a mirror read pass transistor (45). In the reflective LCD array (10) has a plurality of system cells (36), wherein data is written to a mirror (33). A measurement device (76) which, in one embodiment is a mirror read pass transistor (45) allows read back of voltage on the mirror (33), thereby providing a measurable criteria for determining if the mirror (33) a mirror electrical contact (43) and associated driving circuitry such as a master cell (40), a slave cell (41) and an analog mux (42) are properly connected and functioning.
Claims26
A wafer based imaging device including a mirror acting as an electrode, said wafer based imaging device comprising:
- a first mirror electrical contact for providing data to the mirror;
- and
- a second mirror electrical contact for reading data from the mirror.
A method for testing a wafer based imaging device having a mirror acting as an electrode, comprising:
- (a) writing data to the mirror;
- and
- (b) reading data from the mirror to determine if said data was properly written to the mirror in step (a).
In a reflective LCD imaging device having a mirror acting as an electrode and a first mirror electrical contact for transferring data to the mirror therethrough, an improvement comprising:
- an additional electrical contact on the mirror for reading data from the mirror therethrough.
Dependencies are inferred from the claim text.