Method and apparatus for buckling beam testing
AssigneeIntel Corporation
InventorCharlie Deng
Life of this patent
Estimating the term…
Abstract
A buckling beam testing assembly including a frame and one or more buckling beam wires coupled to the frame, each wire having a main body having a first end couplable to a testing apparatus and a second end having a cross-sectional area, each wire having a tip for piercing or penetrating a contact point of a device being tested. Each tip has a base portion attached to the second end of the main body, wherein the base of each tip has a cross-sectional area smaller than the cross-sectional area of the second end.
Claims27
A testing assembly comprising:
- a frame;
- and
- one or more elongated wires coupled to the frame, each wire having a main body having a first end couplable to a testing apparatus and a second end having a single tip for contacting a contact point, each single tip having a base portion attached to the second end of the main body, wherein the base of each tip has a cross-sectional area smaller than a cross-sectional area of the second end such that a shoulder is defined at the second end, wherein the shoulder limits a depth that the tip can penetrate the contact point.
A buckling beam for a buckling beam testing assembly, the buckling beam comprising:
- an electrically conductive and bendable elongated wire body having a first end couplable to a testing apparatus and having a second end having a tip extending from the second end in alignment with the elongated wire body, the tip for contacting or penetrating a contact point of a device being tested;
- wherein said second end includes a shoulder located near the tip for limiting a depth the tip can penetrate said contact point if the tip penetrates the contact point.
A testing assembly for testing a circuit having a plurality of contact points, the testing assembly comprising:
- a frame;
- a plurality of elongated wire buckling beams carried by the frame, each buckling beam having a first end couplable to a testing apparatus and having a second end including a tip extending from the second end in alignment with the elongated wire, the tip for contacting or piercing one or more of the plurality of contact points;
- and
- means for limiting a distance the second end of each buckling beam can penetrate a contact point if the second end pierces the contact point.
A system for testing a circuit having one or more test contact points arranged in a pattern, the system comprising:
- a holder for holding the circuit;
- a testing apparatus for analyzing the circuit;
- a frame having one or more guide plates, each guide plate having one or more through-holes which substantially match the pattern of the one or more test contact points of the circuit;
- one or more buckling beam members attached to the frame and located within one or more of the through-holes;
- and
- means for moving the frame and the holder closer to each other wherein the one or more buckling beams contact one or more of the contact points;
- said one or more buckling beams each comprising an elongated, electrically conductive wire, each buckling beam having a first end operatively coupled to the testing apparatus and having a second end for contacting one or more of the test contact points, the second end having a tip and also having a shoulder portion located above the tip.
A method of buckling beam testing of a circuit having a contact point, the method comprising:
- moving an end of a buckling beam wire towards a contact point in a direction parallel to an axis of the buckling beam wire to effect contact or penetration of the contact point by the end of the buckling beam wire;
- and
- providing a shoulder near a tip of the buckling beam wire to limit a depth of penetration of the wire if the buckling beam wire reaches a predetermined depth in the contact point.
Dependencies are inferred from the claim text.