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US 6,650,132 B2Granted
Method and apparatus for temperature control of a device during testing
AssigneeDelta Design, Inc.
InventorJean Luc Pelissier
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AssigneeDelta Design, Inc.
InventorJean Luc Pelissier
Estimating the term…
A method for controlling the temperature of a DUT during a testing operation, includes a) measuring a parameter related to power consumption by the DUT during testing, such as current consumption; and b) using the parameter related to power consumption to operate a temperature control device to compensate for temperature change due to changes in power consumption by the DUT during testing. The control can be closed loop or open loop with control signals incorporated into a test program. Apparatus for controlling the temperature of a DUT during testing, includes a) a device for measuring a parameter related to power consumption by the DUT during testing; b) a temperature control device which operates to control the temperature of the DUT during test; and c) a device for controlling operation of the temperature control device according to the measured parameter related to power consumption.
A method of controlling the temperature of a device, the method comprising:
An apparatus for controlling the temperature of a device, comprising:
A system for controlling the temperature of a device, comprising:
Dependencies are inferred from the claim text.