Methods for determining characteristics of interface devices used with vector network analyzers
AssigneeAnritsu Corporation
InventorJon S. Martens
Life of this patent
Estimating the term…
Abstract
Methods are provided for characterizing N interface devices (e.g., adapters or test fixture arms) using a vector network analyzer (VNA). These N interface devices are useful for connecting an N-port device under test (DUT) to the VNA. A first step of includes performing an N-port calibration at each of N outer reference planes. A second step includes performing an N-port calibration at each of N inner reference planes. A set of scattering-parameters (S-parameters) is then determined for each of the N interface devices based on results of the calibrations performed at the first step and results of the calibrations performed at the second step. Each set of S-parameters characterizes a respective one of the N interface devices.
Claims22
A method for characterizing a first interface device and a second interface device using a vector network analyzer (VNA), the first and second interface devices useful for connecting a two-port device under test (DUT) to the VNA, the method comprising the steps of:
- (a) performing a two-port calibration at each of a first outer reference plane and a second outer reference plane;
- (b) performing a two-port calibration at each of a first inner reference plane and a second inner reference plane;
- and
- (c) determining a set of scattering-parameters for each of the first and second interface devices based on results of the calibrations performed at step (a) and results of the calibrations performed at step (b), each set of scattering-parameters characterizing a respective one of the first and second interface devices.
A method for characterizing N interface devices using a vector network analyzer (VNA), the N interface devices useful for connecting an N-port device under test (DUT) to the VNA, where N is an integer≧2, the method comprising the steps of:
- (a) performing an N-port calibration at each of N outer reference planes;
- (b) performing an N-port calibration at each of N inner reference planes;
- and
- (c) determining a set of scattering-parameters for each of the N interface devices based on results of the calibrations performed at steps (a) and results of the calibrations performed at step (b), each set of scattering-parameters characterizing a respective one of the N interface devices.
A method for characterizing a first interface device and a second interface device using a vector network analyzer (VNA), the first and second interface devices useful for connecting a two-port device under test (DUT) to the VNA, the method comprising the steps of:
- (a) performing a two-port calibration at each of a first outer reference plane and a second outer reference plane in order to determine a first set of error coefficients for each port of the VNA, each first set of error coefficients relating to errors associated with a port of the VNA;
- (b) performing a two-port calibration at each of a first inner reference plane and a second inner reference plane in order to determine a second set of error coefficients for each port of the VNA, each second set of error coefficients relating to errors associated with a port of the VNA plus errors associated with one of the interface devices;
- and
- (c) determining a set of scattering-parameters for each of the first and second interface devices by extracting results of the calibrations performed at step (a) from results of the calibrations performed at step (b), each set of scattering-parameters characterizing a respective one of the first and second interface devices.
A method for characterizing N interface devices using a vector network analyzer (VNA), the N interface devices useful for connecting an N-port device under test (DUT) to the VNA, where N is an integer≧2, the method comprising the steps of:
- (a) performing an N-port calibration at each of N outer reference planes;
- (b) performing an N-port calibration at each of N inner reference planes;
- and
- (c) determining a set of scattering-parameters for each of the N interface devices by extracting results of the calibrations performed at step (a) from results of the calibrations performed at step (b), each set of scattering-parameters characterizing a respective one of the N interface devices.
Dependencies are inferred from the claim text.