Field-effect controlled semiconductor device having a non-overlapping gate electrode and drift region and its manufacturing method
AssigneeInfineon Technologies AG
InventorsWolfgang Werner, Franz Hirler
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AssigneeInfineon Technologies AG
InventorsWolfgang Werner, Franz Hirler
Estimating the term…
A semiconductor component includes a first connection zone of a first conductivity type for providing a contact at a first side of a semiconductor body and a second connection zone of the first conductivity type for providing a contact at the second side of the semiconductor body. A drift zone adjoins the first connection zone and extends in a vertical direction of the semiconductor body as far as the second side of the semiconductor body. A body zone of a second conductivity type is disposed between the second connection zone and the first connection zone or the drift zone. A control electrode is insulated from the semiconductor body and disposed above the body zone such that the control electrode substantially does not overlap with the drift zone and the second connection zone in a lateral direction. A method for manufacturing a semiconductor component is also provided.
A semiconductor component, comprising:
A method for manufacturing a semiconductor component, the method which comprises:
A method for manufacturing a semiconductor component, the method which comprises:
Dependencies are inferred from the claim text.