Semiconductor wafer, semiconductor chip, semiconductor device and method for manufacturing semiconductor device

A semiconductor chip including a non-volatile memory array, said non-volatile memory array comprising:

• a first memory area for storing input information of usual operation;
• a second memory area for storing historical information of an electrical characteristic test of said first memory area;
• and
• a third memory area for storing historical information of an electrical characteristic test of a volatile memory chip.

A semiconductor device mounting a semiconductor chip including a non-volatile memory array, said non-volatile memory array comprising:

• a first memory area for storing input information of usual operation;
• a second memory area for storing historical information of an electrical characteristic test of said first memory area;
• and
• a third memory area for storing historical information of an electrical characteristic test of a volatile memory chip.

A semiconductor device comprising:

• a first semiconductor chip including a non-volatile memory array comprising:
• a first memory area for storing input information of usual operation, and
• a second memory area for storing historical information of an electrical characteristic test of said first memory area;
• and
• a second semiconductor chip including a volatile memory array comprising a third memory area for storing input information of usual operation,
• wherein historical information of an electrical characteristic test of said third memory area of said second semiconductor chip is stored into said second memory area of said first semiconductor chip.

A semiconductor device comprising:

• a semiconductor chip including a non-volatile memory having a first memory area for input information of usual operation, and a second memory area for historic information of an electrical characteristic test;
• and
• a semiconductor chip having a volatile memory,
• wherein said second memory area of said non-volatile memory stores information of an electrical characteristic test of said volatile memory.