Method for generating expect data from a captured bit pattern, and memory device using same
AssigneeMicron Technology, Inc.
InventorTroy A. Manning
Life of this patent
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AssigneeMicron Technology, Inc.
InventorTroy A. Manning
Estimating the term…
Expect data signals are generated for a series of applied data signals having a known sequence to determine if groups of the applied data signals were properly captured. A first group of the applied data signals is captured, and a group of expect data signals are generated from the first group. A second group of the applied data signals is then captured and determined to have been properly captured when the second group corresponds to the group of expect data signals. In this way, when a captured series of data signals is shifted in time from an expected capture point, subsequent captured data signals are compared to their correct expected data signals to determine whether the group, although shifted in time, was nonetheless correctly captured. Expect data signals are generated in this manner and may be utilized in a variety of integrated circuits, such as an SLDRAM.
A method for generating expect signals for a series of signals having a known sequence being applied on a bus of a memory device to determine if the applied signals are being properly captured by the memory device, the method comprising:
A method for synchronizing a data bus of a memory device, the method comprising:
A method of synchronizing a data bus of a dynamic random access memory, the memory including storage devices for storing data signals on the data bus responsive to an internal clock signal, and the method comprising:
Dependencies are inferred from the claim text.