Semiconductor memory device for reducing number of input cycles for inputting test pattern
AssigneeNEC Electronics Corporation
InventorToshiaki Akioka
Life of this patent
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AssigneeNEC Electronics Corporation
InventorToshiaki Akioka
Estimating the term…
A memory device is provided for reducing the test time and the complexity of the test pattern. The memory device is composed of a memory cell array including a plurality of memory cells, an I/O buffer, a command providing unit, an address providing unit, and an address decoder. The command providing unit is responsive to a test mode signal for providing a command that controls an access to the memory cell array. The address providing unit provides an address in response to the command. The address decoder allows the memory cell array to be accessed in response to the address. The command providing unit sets the command to be a predetermined internal command when the test mode signal is activated. The command providing unit, when the test mode signal is not activated, receives an external command through the I/O buffer and sets the command to be the external command.
A memory device comprising:
A memory device comprising:
A method of operating a memory device comprising:
A method of operating a memory device comprising:
Dependencies are inferred from the claim text.