Method and apparatus to reduce the amount of redundant memory column and fuses associated with a memory device

An apparatus, comprising:

• means for coupling a first group of redundant memory columns to a first redundant input-output circuit;
• means for coupling a second group of non-redundant memory columns to a second non-redundant input-output circuit, a fewer amount of memory columns exist in the first group of redundant memory columns than in the second group of non-redundant memory columns;
• means for coupling a first fuse to a non-redundant input-output circuit, the first fuse to indicate whether one or more memory columns are defective in a group of non-redundant memory columns coupled to the non-redundant input-output circuit;
• means for coupling a second fuse to a first circuit, the first circuit to identify which sub-input-output circuit in the non-redundant input-output circuit is coupled to the one or more defective memory columns;
• means for performing a data transfer operation with a first sub input-output circuit in an input-output circuit, the input-output circuit containing a plurality of sub input-output circuits that each receives a separate activation signal;
• and
• means for activating the first sub input-output circuit to perform the data transfer operation without globally activating the plurality of sub input-output circuits contained within the input-output circuit.

A method, comprising:

• performing a data transfer operation with a first sub input-output circuit contained within an input-output circuit,
• sending a separate activation signal to at least two or more sub input-output circuits in the input-output circuit;
• and
• activating the first sub input-output circuit to perform the data transfer operation without globally activating the two or more sub input-output circuits.

An apparatus, comprising:

• means for performing a data transfer operation with a first sub input-output circuit contained within an input-output circuit,
• means for sending a separate activation signal to at least two or more sub input-output circuits in the input-output circuit;
• and
• means for activating the first sub input-output circuit to perform the data transfer operation without globally activating the two or more sub input-output circuits.

A method, comprising:

• indicating with a first fuse whether one or more memory columns are defective in a first group of non-redundant memory columns coupled to a first non-redundant input-output circuit, the first non-redundant input-output circuit is associated with a plurality of sub input-output circuits;
• and
• identifying a particular sub-input-output circuit that is coupled to the one or more memory columns that are defective by using a second fuse;
• shifting a data operation from a first sub input-output circuit coupled to one or more defective memory columns over to a second sub input-output circuit located in an adjacent input-output circuit.

An apparatus, comprising:

• means for indicating with a first fuse whether one or more memory columns are defective in a first group of non-redundant memory columns coupled to a first non-redundant input-output circuit, the first non-redundant input-output circuit is associated with a plurality of sub input-output circuits;
• and
• means for identifying a particular sub-input-output circuit that is coupled to the one or more memory columns that are defective by using a second fuse;
• means for shifting a data operation from a first sub input-output circuit coupled to one or more defective memory columns over to a second sub input-output circuit located in an adjacent input-output circuit.